首页> 外文OA文献 >Indel-seq: a fast-forward genetics approach for identification of trait-associated putative candidate genomic regions and its application in pigeonpea (Cajanus cajan)
【2h】

Indel-seq: a fast-forward genetics approach for identification of trait-associated putative candidate genomic regions and its application in pigeonpea (Cajanus cajan)

机译:Indel-seq:鉴定性状相关推定候选基因组区域的快进遗传学方法及其在木豆中的应用(Cajanus cajan)

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Identification of candidate genomic regions associated with target traits using conventional mapping methods is challenging and time-consuming. In recent years, a number of single nucleotide polymorphism (SNP)-based mapping approaches have been developed and used for identification of candidate/putative genomic regions. However, in the majority of these studies, insertion–deletion (Indel) were largely ignored. For efficient use of Indels in mapping target traits, we propose Indel-seq approach, which is a combination of whole-genome resequencing (WGRS) and bulked segregant analysis (BSA) and relies on the Indel frequencies in extreme bulks. Deployment of Indel-seq approach for identification of candidate genomic regions associated with fusarium wilt (FW) and sterility mosaic disease (SMD) resistance in pigeonpea has identified 16 Indels affecting 26 putative candidate genes. Of these 26 affected putative candidate genes, 24 genes showed effect in the upstream/downstream of the genic region and two genes showed effect in the genes. Validation of these 16 candidate Indels in other FW- and SMD-resistant and FW- and SMD-susceptible genotypes revealed a significant association of five Indels (three for FW and two for SMD resistance). Comparative analysis of Indel-seq with other genetic mapping approaches highlighted the importance of the approach in identification of significant genomic regions associated with target traits. Therefore, the Indel-seq approach can be used for quick and precise identification of candidate genomic regions for any target traits in any crop species.
机译:使用常规作图方法鉴定与靶性状相关的候选基因组区域是一项艰巨且耗时的工作。近年来,已开发了许多基于单核苷酸多态性(SNP)的作图方法,并将其用于鉴定候选/假定的基因组区域。但是,在这些研究中的大多数中,插入缺失(Indel)在很大程度上被忽略了。为了有效地利用Indels定位靶标性状,我们提出了Indel-seq方法,该方法是全基因组重测序(WGRS)和批量分离子分析(BSA)的组合,并依赖于极大量的Indel频率。部署Indel-seq方法以鉴定与木豆枯萎病(FW)和不育性花叶病(SMD)抗性相关的候选基因组区域,已鉴定出影响26个推定候选基因的16个Indel。在这26个受影响的推定候选基因中,有24个基因在该基因区域的上游/下游显示作用,而两个基因在这些基因中显示作用。对其他FW和SMD抗药性以及FW和SMD易感基因型的这16个候选Indel的验证显示,五个Indel的显着相关性(FW为三个,SMD抗性为两个)。 Indel-seq与其他遗传作图方法的比较分析强调了该方法在鉴定与靶性状相关的重要基因组区域中的重要性。因此,Indel-seq方法可用于快速,准确地识别任何作物物种中任何目标性状的候选基因组区域。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号